Workshop on EELS in Materials Science
Uppsala, 18th-20th June 2012
The detailed program can be downloaded from here:
Program.pdf (72 KB)
The abstract booklet can be downloaded from here:
EELS2012.pdf (10 MB)
Monday, June 18th
8:00 Welcome and registration
9:00 Session I: Introduction to EELS (chair: K. Leifer)
9:05 Cécile Hébert (invited), École Polytechnique Fédérale de Lausanne, Switzerland
Tutorial-Basics of EELS
Coffee break
Session II: Applications in material sciences (chair: W. Sigle)
10:30 Alan J. Craven, (invited), University of Glasgow, Scotland, UK
Investigations of Materials using STEM/EELS
11:15 Justyna Grzonka, Warsaw University of Technology, Poland
STEM and EELS characterization of carbon nanotubes coated with nickel
11:35 Peter Švec, Slovak Academy of Sciences, Bratislva, Slovakia
Application of elemental mapping in the study of structure and chemistry of rapidly quenched nanocrystallized Fe-B based systems
Lunch break
Session III: Low loss EELS (chair: C. Hébert)
13:30 Wilfried Sigle (invited), Max Planck Institute for Intelligent Systems, Stuttgart, Germany
Basics and applications of low-loss EELS
14:15 Alberto Eljarrat, University of Barcelona, Spain
AlN/GaN DBR layer low-loss EELS-HAADF compositional mapping
14:35 Stéphane-Olivier Guillaume, University of Namur, Belgium
Simulating EELS spectra of isolated and coupled metallic nanoparticles in the discrete dipole approximation
14:55 Felix von Cube, Universität Bonn, Germany
Electron energy loss spectroscopy on coupled metamaterials
Coffee break and poster session
Session IV: Electron and X-ray spectroscopies (chair: S. Muto)
16:45 Svante Svensson (invited), Uppsala University, Sweden
Electron spectroscopy - historical review and recent developments
17:30 Nestor J. Zaluzec (invited), Argonne National Laboratory, USA
X-ray and Energy Loss Spectroscopy in Aberration Corrected Systems
18:15 Guillermo M. Herrera, Universidad de Valencia, Spain
Excited states in YVO4 measured by x-ray absorption spectroscopy
Tuesday, June 19th
Session V: Angular resolved EELS techniques: dichroism and channeling (chair: S. Rubino)
9:00 Peter Schattschneider (invited), Vienna University of Technology
Electrons with a twist: Dichroism and vorticity in the TEM
9:45 Klaus Leifer, Uppsala University, Sweden
Reciprocal space signals arising from interference of core-loss electrons in the EMCD geometry
10:05 Yasuo Ito (invited), Northern Illinois University, DeKalb, USA
Magnetic Linear Dichroism by Momentum Resolved EELS
10:25 Kazuyoshi Tatsumi, Nagoya University, Japan
Two Schemes for Electron Channeling EELS by Digital Beam Control
Coffee break
Session VI: Advances in EELS instrumentation (chair: A. Craven)
11:15 Neil Wilkinson, Gatan Inc., Abingdon, UK
Quantum GIF - Taking advantage of the new breed of TEM's
11:45 Gerd Benner, Carl ZeissNTS GmbH, Oberkochen, Germany
New analytical capabilities of an in-column EFTEM with monochromator
12:15 Mike Capers, Hitachi High-Technologies Europe GmbH, Krefeld, Germany
Spatially resolved EELS and EELS tomography
Lunch break
Session VII: ELNES and simulation (chair: P. Schattschneider)
14:15 Jan Rusz (invited), Uppsala University, Sweden
Orientation-sensitive ELNES – convergence of Bloch waves method
15:00 Shunsuke Muto (invited), Nagoya University, Japan
A new method for extracting EMCD signals from spectrum diffraction datacubes using a multivariate curve resolution technique
Coffee break
Session VIII: New instrumentations and methods (chair: N. Zaluzec)
16:15 Fredrik Andersson, JEOL (Skandinaviska) AB, Sollentuna, Sweden
Recent results with the high resolution electron microscope JEOL JEM-ARM 200F
16:45 Christoph Mitterbauer, FEI Company, Eindhoven, The Netherlands
Titan platform news
17:15 Simon Schneider, École Polytechnique Fédérale de Lausanne, Switzerland
Angular momentum resolved EELS by energy filtered nanobeam diffraction
17:35 Round table and closing remarks
20:00 Workshop dinner
Wednesday, June 20th
Laboratory demonstrations
INVITED SPEAKERS
A. J. Craven, Glasgow, United Kingdom
C. Hébert, Lausanne, Switzerland
Y. Ito, Chicago, USA
S. Muto, Nagoya, Japan
P. Schattschneider, Vienna, Austria
W. Sigle, Stuttgart, Germany
S. Svensson, Uppsala, Sweden
N. J. Zaluzec, Chicago, USA
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2012. UPPSALA UNIVERSITY, Department of Engineering Sciences, Electron Microscopy and Nanoengineering, Box 534, SE-751 21 Uppsala Informational liable | Webmaster
Last updated
2012-07-02 |
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